A Combined BEM/FEM Method for IC Substrate Modeling
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چکیده
منابع مشابه
Combined BEM/FEM vs. 3DFEM Substrate Resistance Modeling
In the context of substrate resistance modeling a combined BEM/FEM method is compared to a 3DFEM method. The combined BEM/FEM method is applicable in substrate modeling problems which involve layout-dependent doping patterns for which a standalone BEM would not be accurate enough and for which a standalone FEM would be too slow. The method captures local couplings within the doping pattern with...
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SUMMARY In the design and fabrication of micro-electronic circuits, it is necessary to simulate and predict many kinds of effects, such as substrate crosstalk, interconnect delays and others. In order to simulate and predict properly these effects, accurate and efficient substrate modeling methods are required. Substrate resistance extraction involves finding a resistance network between ports ...
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